RELIABILITY IMPROVEMENT OF INTEGRATED CIRCUITS AND SYSTEMS IN NANOMETER TECHNOLOGY

Abstract: 

CMOS technology evolution has allowed the integration of a large number of cores on a single die (System-on-Chip design paradigm). However, shrinking geometries and greater design complexity make Integrated Circuits (ICs) testing more difficult and cause reliability problems. One-time factory testing of ICs after fabrication is insufficient in the nanometer era, making testing in the field necessary.

Test data volume, test application time and power consumption during testing are critical parameters for both manufacturing and on-field testing. Variability, aging, power supply fluctuations and temperature effects can lead to intermittent faults and in some cases to permanent faults as well. Finally, technology scaling drastically affects SRAM memory and logic susceptibility to radiation effects that substantially increase transient fault generation and error rates.

In this project we will develop new test data compression and BIST techniques, suitable for manufacturing and several types of periodic testing, aiming at small test data volume, small test application time and low-power consumption during testing. We will also develop soft-error resilient circuits as well as error detection and correction techniques for transient and intermittent faults. Considering the evaluation of transient and intermittent fault mitigation techniques, suitable integrated circuits will be designed and fabricated in advanced CMOS technologies available to research organizations. In addition, radiation experiments on the fabricated chips will be carried out to verify their soft error resilience properties.

The development of low cost unified approaches for reliability improvement in nanometer technologies, targeting permanent, transient and intermittent faults will be the outcome of this project.

Project info

Acronym:
REIN
Coordinating Institution:
University of Patras
Scientific Coordinator:
Nikolos Dimitris
Research Team 2 Leader:
Pekmestzi Kiamal
Research Team 3 Leader:
Arapoyanni Angela
Research Team 4 Leader:
Tsiatouhas Yiorgos
Research Team 5 Leader:
Lagogiannis Anastasios

Stats

I.D.:
1217
Mis:
376998
Duration (months):
47
Budget:
600 000.00
Diavgeia:
ΑΔΑ: Β4ΛΡ9-Θ9Ι

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